A+ R A-

Authors Publications

Publications (most can be found on the Google site: keyword: “F.Ferrieu ellipsometer”): unpublished reports 1. · “Détermination des couplages hyperfins des protons dans le radical libre Tanol. Application à l'étude du temps de relaxation nucléaire et de l'effet OverHauser dans un Crystal paramagnétique ». Thèse 3me cycle (Spectrométrie Physique) Grenoble 1972. 2. · « Théorie et application des mesures de relaxation nucléaire TIN et de résonance paramagnétique Électronique (RPE) dans les composes de Heisenberg uni ou bidimensionnels. (PHd thesis january 1978.(Thèse de Doctorat d'Etat es-Sciences Physiques .Janvier 1978))
PHD  thesis:
1 M. Nechtschein, H. Jouve, F. Ferrieu and J.P. Boucher Physics Letters, 36A, 347, (1971).
2 F. Ferrieu and M. Nechtschein Chemical Physics Letters, 11,46 (1971).
3 J. Boucher, F. Ferrieu and M. Nechtschein Physical Review, 89, 3871 (1971).
4 -Bakheit, Y. Barjhoux, F. Ferrieu, M. Nechtschein and J Boucher Solid State Comm.15,25,(1974).
5 F. Ferrieu Phys. Letters, 49A, 253(1974)

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6Y. Barjhoux, J.P.Boucher, F. Devreux, F. Ferrieu et M. Nechtschein. Journal de Physique, 36,109 (1975).
7 C. Jeandey, J.P. Boucher, F. Ferrieu and M. Nechtschein Solid State Comm. (1978).
8 F. Ferrieu, J. Phys. (Paris) 38 , L381 (1977).
9 Ferrieu and M. Nechtschein 10eme symposium sur les radicaux libres (Lyon 1971).
10 J.P. Boucher, F. Ferrieu and M. Nechtschein, Proceedings of the XVIIth Colloque Ampere (Turku 1972).
11 J.P. Boucher, F. Ferrieu and M. Nechtschein Inter. Conference on Magnetism (Moscou 1973).
12 Y. Barjhoux, F. Devreux, J.P. Boucher, F. Ferrieu and M. Nechtschein XVIllth Ampere Congress (Nottingham 1974) proceedings p.89
13 F. Ferrieu and J. P. Boucher. XIXth Ampere Congress, Heidelberg, sept. 1976.

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IBM Post Doctoral (78-80)).
14 F. Ferrieu and M. Pomerantz. American Physical Society Meeting March 19-23, 1979.15 F. Ferrieu and M. Pomerantz Solid-State Comm.,39,707-710 (1981). and M. Pomerantz. Journal of Magnetism and Magnetic Materials. 1064 (1981).

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CNS/CNET Centre d’Études des Télécommunications)(1980-2000)
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16 B. Villepelet, F. Ferrieu, A. Grouillet and A. Golanski Nucl.lns. Methods Phys. Res., 81, 137-141(1981).
17 F. Ferrieu, G. Bomchil, D. Bensahel, A. Golanski, and F. Ferrieu Appl. Physics Letters 41, 46-48(1982)
18 R.A.B. Devine, F. Ferrieu and A. Golanski (IBMM82 Conf. Grenoble (France)1982 proceeding p1201-1206
19 F. Ferrieu Rad.Effects,62,231- 236(1982).
20 F. Ferrieu and G. Auvert Journal Applied Phys,54,5,2646-2649(1983).
21 P. Montaudon, M. H. Debroux, F. Ferrieu and
A. Vareille Thin Solid films, 125, 3-4,235-241 (1985).-
22 C. Viguier, F. Ferrieu, A. Cros and A. Humbert Solid State Comm. 60,12,923- 926(1986)
23 F. Ferrieu, C. Viguier, A. Cros and A. Humbert Solid State Comm. 62,7,455- 459(1987)
24 F. Ferrieu, F. Bernoux and J.L. Stehle Métrologies 86,Le Vide ,les couches minces ,41,supp 233,89-91 (1986)
25 F. Ferrieu, D.P.Vu, C.D'anterroches Oberlin J.C. J. Applied. Phys., 62, 8,3458-3461(1987).
26 G. Goltz, F. Ferrieu and L. Ottavi. Le vide les couches minces 1987 42, 236,183-185
27 F. Ferrieu and J.H. Lecat ICTF7 New Delhi and Thin Solid 164, 43-50(1988).
28 F. Ferrieu and J.H. Lecat, Mat. Res. Soc. Symposium. Proceeding vol 101,403-408 (1988)
29 S. Andrieu, F. Ferrieu and A. Arnaud d'Avitaya. Applied Physics A: Materials Science & Processing, Volume 49, Number 6 / décembre 1989
30 R.A.B. Devine and F. Ferrieu 113,100-102 J. of non-cryst. Solids (1989).
31 F. Ferrieu Journal of Sci. Instruments. 60(10) Oct.1989 p 3212
32 F. Ferrieu J.H. Lecat Electrochemical Society meeting (ECS) Berlin Sept 15th 1989). Invited paper and Journal of the Electrochemical Society vol 137, 7, 2203 July1990
33 F. Ferrieu and D. Dutartre. Journal of Applied Physics 68, 11, 5810(1 Nov 1990).
34 F. Ferrieu, O. Halimaoui, and D. Bensahel Solid State Com. 84,3,293-296(1992)
35 F. Ferrieu, F. Beck, and D. Dutartre Solid State Com. Vol82,6, 427-430 (1992).
36 L. Vallier, O. Joubert, R. Burke, F. Ferrieu and R.A.B. Devine Mater. Research Soc Symp. Proc. Vol 284, 193-195 (1993)
37 P. Boucaud, F. Glowacki,Y. Campedelli F.Ferrieu A. Larré,D. Bensahel J Electron Material (1993).
38 P. Badoz, D. Bensahel, Bomchil G., F. Ferrieu, O.Halimaoui, Perret P.,
39 J.L. Regolini, I. Sagnes,G. Vincent Mat. Research.Soc.Fall Meeting 92 Proc, 1993 97-108.
40 P. Boucaud, F. Glowacki, F.Ferrieu A. Larré,D. Bensahel Thin Solid Films 248, Issue 1, 1 August 1994, Pages 1-5 (1993)
41 . "Growth and in situ ellipsometric analysis of Si1-xGex alloys deposited by Chemical Beam Epitaxy" P. Boucaud, F. Glowacki, Y. Campidelli, A. Larré, F. Ferrieu, D. Bensahel Journal of Electronic Materials 23, 565 (1994).
42 ICTF10 23-27 sept 1996 Salamanca ThAFPo018 poster and F.Ferrieu, C. Morin, J. L. Regolini Thin Solids Films, 315,316-321 (1998).
43 F. Ferrieu Applied Physics Letters ,73,16,2316-2318 (1998).
44 F. Ferrieu Applied Physics Letters 76,15,2023 (2000).
45 F. Ferrieu, P. Ribot, J.L. Regolini Thin Solids Films 373,211-215 (2000).

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STMicroelectronics  Letii Minatec

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46 DUV Spectroscopic Ellipsometry F.Ferrieu Poster SiO2 2004 Trento (Italy).
47 4th Workshop Ellipsometry Berlin 20-22th
feb.2006 « Spectroscopic Ellipsometric Porosimetry (EP) in the low pressure regime : how pressure and temperature stability control enhances measurement’s accuracy ». G.Simon and F.Ferrieu, A.Bourgeois,A.Brunet-Bruneau and J.Rivory (Poster)
48 F. Ferrieu, K. Dabertrand, S. Lhostis, V. Ivanova, E. Martinez, C. Licitra, G. Rolland, J. Non-Cryst. Solids 353 (2007) 658.
49 Metrology and characterization of PECVD low temperature dep. Amorphous carbon” F.Ferrieu, C.Chaton,D.Neira et al 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics FCMN2007”
50 Molecular Fractal Surfaces Analysis by Spectroscopic Ellipsometry F. Ferrieu 1, J.P. Piel .et al (2008) ICSE4 Stockholm to be published in Surf. Sci.
51 S. Margeron, F.Ferrieu et al Workshop WoDIM July 2008 Poster
52 Mueller matrices approach to the propagation of light in stratified anisotropic media ICSE4 Stockholm 2008 poster submitted unpublished
53 “Spectroscopic Polarimetry of Light Scattered by Surface Roughness and Textured Films in Nanotechnologies “F. Ferrieue 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (may 2009).
54. “Etude de films par spectroscopie Raman UV et par ellipsometrie spectroscopique DUV « S. Margueron 1, F. Terrenoir 1, V. Brizé 1, M. Moreau 2, E. Pichonat 2, S. Lhostis 3, F. Ferrieu (2008) ECS conf july 2008
55 Physical surface adsortpion and molecular surface fractal analysis (MFSA) detected with Spectroscopic ellipsometryon surfaces and.. Surf. Sc. F.Ferrieu ( to be published in Appl. Surf.Sci. 2009).
56 Spectroscopic Polarimetry of light scattered by surface roughness.., Poster FCMN09 Albany USA mars 2009.
57 . “Polarimetry of light scattered by surface roughness and periodic structures in Nanotechnologies”Poster NanoCharm Ist Worshop Polarimetry API09 Dec.2009 poster). logo publi.pdf

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58."Analysis of textured films and periodic grating structures with Mueller matrices: A new challenge in instrumentation with the generation of angle-resolved SE polarimeters"     Original Research Article
Thin Solid Films,  Volume 519, Issue 9,  28 February 2011,  Pages 2608-2612 F. Ferrieu, T. Novikova, C. Fallet, S. Ben Hatit, C. Vannuffel and A. De Martino

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59. article avec PHELMA

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60. poster abstrract ICSE6