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SNOWRAY: A very nice step into future
From what we learned before...
Even though being far away...
Meta materials.. Polarimetry Mueller matrices Surface Analysis but what else??
In term of 3D results SNOWRA looks like that : \n Immediate picture!!! .If you get many data...
Think about classical Mapping obtained with XY SE Mapping...and XY data acquisition ... It take a very long time isn't? Even with only 49 points
e.g. with the powerfull Instrument ... the RT300 from Film Sense 60seconds for only 49 points
or other systems...
Is that a new way? ...Let's consider Plank 's law and Material Emissivity
Irradiated multi layers sample gives a unique signature
In the Infra Red related to respective material nature and respective layers stacks thicknesses
with the SNOWRAY technique .. that's what we get
another wafer mapping ..a European Patent...
instantaneous measurement.compareto classical XY mapping..!!
A deep into wafer structure
with powerfull analysis since..for one detail..
One can focus on specific 3D defects detected ...
A SnowRay intial setting today is available...
when setup with In situ Ellipsometer with very fast acquisition rate (10ms)...
which provides an absolute real time calibration ...
the IR Emissivity versus thickness can be thus calibrated.....provide then absolute thickness values..
A new instrument a full real time thickness calibration .

Slideshow CK Opticnano

thats an old one
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2018 wishes


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