The MProbe20
series:another
choice for another thickness range...
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Why use MProbe
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Applications
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Flexible: select the best hardware configuration for your application Affordable: up to 50% savings as compared to other commercial instruments Precision: unmatched precision <0.01nm or 0.01% Materials database: extended database (500+ materials) is included Software: flexible, user friendly and powerful software; integrated control/data acquisition and data analysis; any filmstack: no limits on number of layers, support inhomogeneous and thick incoherent layers, surface roughness, multi-sample analysis, etc. Integration: several integration options are available: Modbus TCP, OPC (DA 2.0/3.0), custom options Technical support: application and technical support |
Practically any translucent or low-absorbing film can be measured: SiO2, SiNx, DLC, Photoresist, Polymer, Polyamide, polySi, nanocrystalline Si, aSi, Si, Parylene, industrial coatings. 1nm-1000µm thickness range Thin-film solar cells: aSi, CIGS, CdT, TCO Semiconductor and dielectric materials (Photoresist, oxides, nitrides, OLED stack) Optical coatings (Anti-Reflection, Hard coatings, Filters) Liquid Crystal displays (Cell Gaps, ITO, Polyamides) Magnetic media, laser mirrors, thin metal films |