Previous Works &international conferences

 "La générosité est l'art d'engendrer la liberté de l'autre"
Copyleft of René Descartes ( 1596-1650 )  

ELLIPSOMETRY  &   Frequently Asked Questions This email address is being protected from spambots. You need JavaScript enabled to view it., This email address is being protected from spambots. You need JavaScript enabled to view it..

  Polarimetry of Light scattered by Surface Roughness
Periodic Structures in Nanotechnologies: A new
Challenge in instrumentation and Modeling

Evolution of Oxide and Oxynitride Absorption band in CMOS Gate
Dielectrics as Studied by Ultraviolet Spectroscopic Ellipsometry

 Caractérisation par ellipsometrie des Matériaux
en couche minces : effet des contraintes sur les
constantes optiquesEllipsometrie.

Mueller matrix approach to the propagation of light in
stratified anisotropic media

Metrology and Optical Characterization of PECVD (RF) low
temperature deposited Amorphous Carbon films.

Spectroscopic EllipsometricPorosimetry(EP) in the low

pressure regime: how pressure and temperature stability control enhances

measurements accuracy  

Brevet xuv(FR)

Ellip- ALD(Langereis) 

FWooten OpticalProperties of solids

Drude_TheoryOfOptics

 C#MuellerDecomposition(FR)

Analysis of textured films and periodic grating structures with Mueller
matrices: A new challenge in instrumentation with the generation of
angle-resolved SE polarimeters